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flash_test
- 一些控制算法去测量nand 或者nor flash架构的特性,这主要针对存储阵列进行的测试方法的控制代码-one method to control Semiconductor Tester to achieve nor or nand flash test,especially for memory array
YLE2440A_128MRAM_1GNand_Bootloader
- 三星2440A ARMbootloader,支持128M内存,1G Nand Flash。-Samsung 2440A ARMbootloader, support 128M memory, 1G Nand Flash.