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atalanta
- 基于stack-at fault的超大规模数字集成电路自动测试向量生成算法（ATPG）。输入.bench格式，输出测试向量。-Automatic test pattern generation (ATPG) algorithm for VLSI circuits
circ
- c program to levelise a combinational vlsi circuits in test pattern generation. it will work for iscas 85 benchmark circuits
05~chapter-03-lfsim
- Slides from "VLSI test" book.
09~chapter-05-lbist
- Slides from "VLSI Test arch" book
03~chapter-02-dft
- Slides from book "VLSI Test principles"
07~chapter-04-atpg
- Slides from "VLSI test" book.
bist 2017 paper
- A new low-power (LP) scan-based built-in selftest (BIST) technique is proposed based on weighted pseudorandom test pattern generation and reseeding. A new LP scan architecture is proposed, which supports both pseudorandom testing and deterministi