这篇文章主要介绍 ARM JTAG调试的基本原理。基本的内容包括了 TAP (TEST ACCESS PORT) 和 BOUNDARY-SCAN ARCHITECTURE 的介绍，在此基础上，结合 ARM7TDMI 详细 介绍了的 JTAG 调试原理。-This article introduces the basic principles of ARM JTAG debug. Basic elements include TAP (TEST ACCESS PORT) and BOUN

嵌入式架构，本文主要讲解了嵌入式架构，方便嵌入式架构的入门学习-Embedded architecture, this article explained the embedded architecture, embedded framework to facilitate entry to learn