基于matlab的图像处理及瑕疵自动检测-Matlab-based image processing and automatic detection of defects

SILICON WAFER DEFECT DETECTION An automated system developed for defect analysis and reporting of defects in a semiconductor wafer-SILICON WAFER DEFECT DETECTION An automated system developed for defect analysis and reporting of defects in a

MATLAB缺陷检测系统 该课题为基于形态学的缺陷检测，素材采用的是光伏板缺陷。通过灰度，二值化，边缘检测，形态学，开闭运算，去除小面积干扰等方法，判断出缺陷所在，定位，并且框出，且计算出各个块面积。配有一个人机交互界面，把缺陷个数，面积等分别显示到GUI界面上。(Matlab defect detection system This topic is based on the morphological defect detection, the material is photovolt

基于MATLAB的工业瑕疵缺陷检测，采用工业板图像作为素材。利用灰度化，二值化，边缘提取，形态学运算等方法，检测并标出出瑕疵所在位置，计算出各个块面积。设计了一个UI界面，显示瑕疵个数和面积等参数。(Industrial defect detection based on MATLAB, using industrial plate image as material. Using gray, binarization, edge extraction, morphological operat