半导体数据训练集和测试集用来检测故障,使用MATLAB编程对数据采集-Semiconductor data training and test sets used to detect faults, using MATLAB programming for data collection

这是用ELM（极限学习机）做的关于图像识别的分类实验，有数据，有程序，有训练时间，测试时间和精度-It is used ELM (Extreme Learning Machine) to do experiments on the classification of image recognition, has data, procedures, training time, test time and accuracy

已知两类离散数据，通过Logistic回归训练，实现两类数据的分类-Two kinds of discrete data are known, through Logistic regression training, to achieve the classification of two categories of data