is a test of a verilog implementation to do a oscilloscope with dual-port RAM

文章给出了RAM测试的策略，并给出了流程图，可以方便的测试RAM的完好性。-In this paper, the strategy RAM test, and gives a flow chart can easily test the good of RAM.

讲述RAM的数据线测试方法。分析地址线短路、断路的测试原理。分析存贮单元测试手段。-About RAM data line test method. The analysis of the address line short-circuit, open circuit test principle. Analysis of storage unit testing means.

有20个无符号数存放在内部RAM从41H开始的存储单元中，试对他们求和并将结果存放在40H单元中（设和小于等于255）-There are 20 unsigned number stored in the internal RAM storage unit from the beginning of the 41H, test for them and the results are stored in the 40H summing unit (set and less than or equ

对指定地址区间的RAM(2000H～23FFH)先进行写数据55AAH， 然后将其内容读出再写到3000H～33FFH中。-The specified address range RAM (2000H ~ 23FFH) first write data 55AAH, then re-read its contents written in 3000H ~ 33FFH.