文件名称:1702_test
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复旦微电子智能IC卡Mifare1和CPU卡读卡机芯片FM1702SL源程序，是设计非接触式射频IC卡的重要资料。-Source code of Mifare1 and CPU NFC card IC for FM1702SL
(系统自动生成,下载前可以参看下载内容)
下载文件列表
1702_test/15693.c
1702_test/15693.LST
1702_test/15693.OBJ
1702_test/1715
1702_test/1715.hex
1702_test/1715.lnp
1702_test/1715.M51
1702_test/1715.plg
1702_test/17XX
1702_test/17XX.lnp
1702_test/17XX.M51
1702_test/17XX.Opt
1702_test/17XX.plg
1702_test/17XX.Uv2
1702_test/17XX_Opt.Bak
1702_test/17XX_Uv2.Bak
1702_test/ABSACC.H
1702_test/AT89X52.H
1702_test/des.c
1702_test/des.LST
1702_test/des.OBJ
1702_test/fm17xx.c
1702_test/fm17xx.h
1702_test/fm17xx.LST
1702_test/fm17xx.OBJ
1702_test/INTRINS.H
1702_test/main.c
1702_test/main.LST
1702_test/main.OBJ
1702_test/pin.h
1702_test/prog.LST
1702_test/psam.c
1702_test/psam.h
1702_test/psam.LST
1702_test/psam.OBJ
1702_test/test.lnp
1702_test/test.M51
1702_test/test.Opt
1702_test/test.plg
1702_test/test_Opt.Bak
1702_test/test_Uv2.Bak
1702_test/uart.c
1702_test/uart.LST
1702_test/uart.OBJ
1702_test
1702_test/15693.LST
1702_test/15693.OBJ
1702_test/1715
1702_test/1715.hex
1702_test/1715.lnp
1702_test/1715.M51
1702_test/1715.plg
1702_test/17XX
1702_test/17XX.lnp
1702_test/17XX.M51
1702_test/17XX.Opt
1702_test/17XX.plg
1702_test/17XX.Uv2
1702_test/17XX_Opt.Bak
1702_test/17XX_Uv2.Bak
1702_test/ABSACC.H
1702_test/AT89X52.H
1702_test/des.c
1702_test/des.LST
1702_test/des.OBJ
1702_test/fm17xx.c
1702_test/fm17xx.h
1702_test/fm17xx.LST
1702_test/fm17xx.OBJ
1702_test/INTRINS.H
1702_test/main.c
1702_test/main.LST
1702_test/main.OBJ
1702_test/pin.h
1702_test/prog.LST
1702_test/psam.c
1702_test/psam.h
1702_test/psam.LST
1702_test/psam.OBJ
1702_test/test.lnp
1702_test/test.M51
1702_test/test.Opt
1702_test/test.plg
1702_test/test_Opt.Bak
1702_test/test_Uv2.Bak
1702_test/uart.c
1702_test/uart.LST
1702_test/uart.OBJ
1702_test