搜索资源列表
AT91RM9200-BasicMmu
- 基于ATMEL AT91RM9200 QFP208的测试源代码，由汇编和C构成，主要用于测试启动时对Flash的读写和相关寄存器设置-ATMEL AT91RM9200 QFP208 based on the test source code, by compiling and C constitute a major test for the commencement of Flash read and write register settings
2410-test
- 利宇泰s3c2410开发板测试程序，包括BUS,UART,RTC,USB,DMA,FLASH
TEST.rar
- S3c2440硬件测试程序，主要功能包括：SDRAM读写测试，整片Falsh读写测试，Flash擦除，坏块检测，flash复制数据到SDRAM,S3c2440 hardware testing procedures, the main features include: SDRAM read and write tests, reading and writing test Falsh whole, Flash erase bad block detection, flash copy the
FM25CL6420110112
- 铁电Flash的驱动测试代码，在FM25CL64上测试通过-ferroelectric Flash diver code.Test OK on FM25CL64
LPC2132-USBMem
- LPC2132、2148下测试可用的USB+FLASH控制方案源代码。-LPC2132, 2148 to test the available USB+ FLASH control program source code.
flash
- 测试c6712的flash ，希望有所帮助、-test flash
nand
- S3C2440下的NANDFLASH测试源码，ADS下的源码！对需要了解2440NANDFLASH控制器和NANDFLASH基本操作原理的兄弟很有帮助！-S3C2440 under NANDFLASH test source, ADS under the source! On the controller and the necessary know 2440NANDFLASH basic operation principle NANDFLASH brothers and helpful!
nand
- 三星S3C2440下操作一款K9F1208NAND Flash的程序代码。在三星板上测试通过-Samsung S3C2440 operated under a code of K9F1208NAND Flash. Samsung panel test
S3C44B0TestCode
- S3C44B0的测试程序，包括AD转换，helloworld，Flash程序-S3C44B0 test procedures, including the AD conversion, helloworld, Flash program
S3C2410_BIOS
- S3C2410 BIOS源码,支持Win CE/Linux的NOR flash与NAND flash下载,还包含有2410各个外设的驱动测试源码-S3C2410 BIOS source code, support for Win CE/Linux for NOR flash and NAND flash download, also includes 2410 test drive at all peripheral source
msp430
- msp430 实验代码 1,MSP430开发基础 2，键盘设计 3，数码管显示电路设计 4，液晶模块接口 5，MSP430 CRC 6，中文输入法 7，数据压缩算法 8，FIR滤波 9，FFT算法 10，波特率自动识别 11,串行存储 12；NAND flash 接口 13；A/ D，TLV2541 14；DA DAC8830 15；ADS1241 16；温度 TMP100 17；定时器 DAC
2440test-20100609
- 2440test为2440开发板的示例程序，请使用ADS编译。 注意：2440test可自适应64M-1GB Nand Flash版本的 mini2440/micro2440-2440test development board for the 2440 sample program, use the ADS compiler. Note: 2440test can be adaptive 64M-1GB Nand Flash version of the mini2440/micro
TIM1-LED-flash
- STM32的最基本测试，所有Io口取反，每隔200ms,实现led的闪-STM32 most basic test, all Io population inversion, every 200ms
MCP2510-Nand-flash-test
- 基于板子s3c2410 MCP2510的nand flash 存储器的实验，开发平台为ads1.2-Board MCP2510 nand flash memory-based experiments, the development platform for ads1.2
STM32-LED--FLASH
- 基于STM32的LED闪烁试验，用于学习I/O的控制。-LED blink test based on the STM32 for the study of I/O control.
SPI-TEST
- stm32f103xx与W25Qxx flash的SPI通信的源代码，基于MDK开发环境。-stm32f103xx and W25Qxx flash of SPI communication source code, based MDK development environment.
c语言测试
- 串口触摸屏显示测试，图表闪烁，按键显示资料(SERI DISPLAY TEST,FLASH TABLE AND KEY)
flashmem
- Data Flash Test Program
Flash
- ar91rm9200进行的flash测试(ar91rm9200 flash-test)
13、SPI-FLASH
- 华邦 2M串行flash测试，并将测试信息通过串口1在电脑的超级终端中打印出来(Winbond 2M serial flash test, and the test information through the serial port 1 in the super computer in print)